PhD position at TU Delft: Simulation of Scanning Electron Microscope (SEM) Images
Electron microscopy is at the heart of innovations and applications on the nanoscale in a wide range of sectors. The technology is, for instance, used in the semiconductor industry to
WG3 (+4) meeting announcement
A combined WG3 / WG4 meeting will take place on 29th of September in Tirana, Albania. This hybrid meeting mainly focuses on the following topics: defect engineering / SII tomography
Thematic issue – Beilstein Journal of Nanotechnology accepting submissions
The deadline for submission to the special issue “Focused ion and electron beams for synthesis and characterization of nanomaterials” of the Beilstein Journal of Nanotechnology (JIF: 3.1) has been extended
Workshop on novel developments and detectors for nano-imaging and nano-analysis
The Luxembourg Institute of Science and Technology will organize a WG1 workshop from 9-10 October 2023. The workshop is dedicated to novel instrumentation and methodologies developments for nano-imaging and nano-analysis.
FIB Roadmap
FIT4NANO members spent the last two grant periods working on the Roadmap for focused ion beam (FIB) technologies, which is now available to the public. Abstract: The focused ion beam (FIB)
FIT4NANO workshop – online participation possible
Registration for the 3rd FIT4NANO workshop in Lisbon is now closed for in person participation. Due to high demand, we will be streaming the workshop to enable participation even if
