Workshop Program

The Book of Abstracts can be downloaded here (2 MB).

For online participants: please be aware that Portugal is on Western European Summer Time (UTC+1).

Monday, 17 July
9:00-10:00G. HlawacekFIT4NANO Core group meeting (on invitation only)
10:00-12:00G. HlawacekFIT4NANO MC meeting (on invitation only)
13:20-14:00Carla Perez MartinezIonic liquids: from space thrusters to focused ion beams
14:00-14:20Djouher BedraneCoaxial Ion Source: pressure dependence of gas flow and field ion emission
14:20-14:40Kirill Atlasov, ZeissCrossbeam fs Laser: Integrated Automated Clean Workflow to Access Multiple Deeply Buried Regions of Interest
14:40-15:00Yang LiStudy of Focused Rb Ion Beam Applications
15:00-15:20Kaih MitchellFocused Ion Beam Milling with Cold Rubidium
15:20-16:00Coffee Break
16:00-16:40Karen KavanaghNegative Ion HIM
16:40-17:00Paul RäckeFocused Beams of Highly Charged Ions for Quantum Technologies
17:00-17:20Katarzyna BerentComparison of Ga+ FIB and Plasma FIB systems used for microstructural characterization
17:20-17:40Miloš Hrabovský, TescanAutomation of FIB-SEM process and open-access control of nanopatterning
17:40-18:00Michael TitzeIn-situ Monitoring of Two-Dimensional Transistors under Low Energy Focused Ion Beam Irradiation
18:00-18:20Katja HöflichFIT4NANO FIB Roadmap
18:20-20:30Poster session
Tuesday, 18 July
9:00-9:40Peter HosemannSurface near Helium damage in materials studied with a high throughput implantation method
9:40-10:00Wolfgang LangIrradiation with focused helium ion beams as a tool for engineering the superconducting properties of copper-oxide high-Tc superconductors on the nanoscale
10:00-10:20Homnath LuitelRoom Temperature Ferromagnetism in non-magnetic semiconductors
10:20-10:40Oleksandr DobrovolskiyFluxonic and Magnonic Devices Enabled by Focused Ion Technology
10:40-11:20Coffee Break
11:20-11:40Ewelina GackaTungsten Field Emitters Fabricated by Helium Ion Beam Integrated with Microelectromechanical Systems
11:40-12:00Bartosz PruchnikFocused ion beam modification of MEMS cantilevers by stress engineering
12:00-12:20Sukriti HansSelf-organized nanopatterning of Ge (100) surface under low-energy ion beam sputtering
12:20-12:40Min Wu, Thermo FisherDamage free 3D characterization and TEM sample preparation of beam sensitive materials using advanced multiple ion source PFIB under cryogenic condition
14:00-14:20Sven BarthBimetallic precursors for focused particle-based deposition
14:20-14:40Iwona SzymańskaNi, Pd, Cu, and Ag FEBID/FIBID potential precursors’ interactions with electrons
14:40-15:00Thomas LoeberAnalysis of Platin deposition and secondary electron yield on Si, InAs and GaAs at differ-ent ion beam voltages and currents with a Cs FIB and a Ga FIB
15:00-15:20Benedykt R. JanyMethod of Testing Decomposition Results of the Metal-organic Precursors for IBID Applications using Gallium FIB
15:20-15:40Lucia HerrerDirect writing of Pd-based micro and nano-structures, electron beam vs Ga+ beam irradiation
15:40-16:20Coffee Break
16:20-17:00Daniela da Silva Nunes GomesFocused ion beam: from health and bioelectronics to environmental
17:00-17:20Tom WirtzMagnetic sector SIMS systems for FIB platforms: new developments, applications, and prospects
17:20-17:40Florian VollnhalsUse for HIM and HIM-SIMS in Correlative Microscopy
17:40-18:00Muhammad Zubair KhanEngineering magnetism in two dimensional phyllosilicates via ion-implantation
~20:00Workshop Dinner
Wednesday, 19 July
9:00 – 9:40Ulrich MantzFIB for microelectronics: instrument developments and applications
9:40 – 10:00Umutcan BektasPolymorph Conversion in Gallium Oxide via Focused Ion Beam
10:00-10:20Nico KlingnerOn demand spatially, controlled fabrication of single photon emitters in Silicon by liquid metal alloy ion source focused ion beam implantation
10:20 – 10:40Kristian StockbridgeDetection efficiency enhancement for deterministic single ion implantation
10:40 – 11:20Coffee break
11:20 – 11:40Dieter KölleNanoSQUIDs for SQUID-on-lever scanning probe microscopy
11:40 – 12:00Vilko MandićImaging of the perovskite solar cell comprising nanostructured electron transfer layer
12:00 – 12:20Alba Arroyo-FructuosoGate-controlled critical current in W-C superconducting nanowires grown by FIBID
12:20 – 12:40Closing + WG meeting preparation
12:40 – 14:00Break
14:00-18:00G. Hobler
K. Höflich
T. Wirtz
G. Rius
G. Hlawacek
WG1/2/3/4 meeting (open to all, parallel sessions)
Invited Speaker
Industry talk

Poster presentations:

If your abstract was accepted as a poster, please prepare a vertical A0 poster; fixing material will be provided by the organizers.

  • Ayşe Bedeloğlu, Bursa Technical University, Focused ion beam technology for energy generation and storage mechanisms based on nanofibers
  • Nils Braun, Leibniz Institute of Surface Engineering e.V. (IOM), Microstructural characterization of layered Cu-Te structures synthesized by focused ion beam
  • Grzegorz Cempura, AGH University of Science and Technology, FIB-SEM tomography – tool for determining the oxidation mechanism of Sanicro 25 steel at a temperature of 700°C
  • Olivier De Castro, Luxembourg Institute of Science and Technology, Structural and compositional insights into biological and beam sensitive samples by using a cryo-FIB instrument equipped with three complementary detection modalities
  • José María De Teresa, INMA (CSIC-University of Zaragoza), Growth and applications of FIBID superconducting deposits and of FEBID magnetic tips
  • Alix Tatiana Escalante Quiceno, INMA – CSIC – Universidad de Zaragoza, Compatibility Analysis of Focused Ion Beam Induced Deposition of Cobalt-based Depos-its under Cryogenic Conditions onto Different Substrates
  • Nicholas Farr, University of Sheffield, Revealing Plasma focused ion beam (O-PFIB) surface interactions on polypropylene using Secondary Electron Hyperspectral Imaging
  • Tomás Fernández Bouvier, Helsinki University, The stability of the bistable carbon defect under proton irradiation
  • Tânia Ferreira-Gonçalves, Universidade de Lisboa, Morphological characterization of gold nanoparticles as versatile tools for photothermal
  • Hajo Frerichs, Quantum Design Microscopy GmbH, Correlative SEM/AFM Microscopy – Combining Two High-Performance Methods for Nanoscale Measurements
  • Timur Griener, Universität Tübingen, Niobium nanoSQUIDs for scanning SQUID-on-cantilever microscopy, patterned by focused Ne and He ion beam milling
  • Andreea-Teodora IACOB, University of Medicine and Pharmacy “Grigore T . Popa”, The formulation and hemolytic assessment of biomimetic polysaccharide electrospun nanofibers
  • Oana Maria Ionescu, University of Medicine and Pharmacy Grigore T. Popa, A overview on the biological effects of hyaluronic acid nanofibers for wound healing applications
  • Nagesh Shamrao Jagtap, Helmholtz-Zentrum Dresden – Rossendorf, Towards hybrid spin-mechanical systems in silicon carbide with helium ion implantation
  • Ville Jantunen, University of Helsinki, Combining binary collision approximation with molecular dynamics for more accurate radiation damage modeling
  • Chinmai Sai Jureddy,  EMPA, In-situ monitoring of focused electron beam induced deposition with platinum-trimethylcyclopentadienylmethyl using mass spectrometer method
  • Krishna Khakurel, ELI beamlines, 4D STEM of Cryo-FIB Milled Cell Lamellae
  • Florentina Lupascu, University of Medicine and Pharmacy Grigore T Popa, Design and Optimisation method for obtaining pioglitazone and curcumin-loaded chitosan nanoparticles
  • Krzysztof Mackosz, Empa, Comparative study of focused electron & ion beam induced deposition (Ga+, Xe+) with
    Cu(II)(hfac)2∙xH2O precursor
  • Jessica Meier, University of Würzburg, Precise fabrication of plasmonic nanostructures using helium ion beam milling of mono-crystalline gold microplatelets
  • Sara Metwally, Institute of Nuclear Physics Polish Academy of Sciences, The effect of 3D hydrogel structure and properties on the escape of single cells from cancer spheroid
  • Dominic Reinhardt, Universität Leipzig, Generation and scaling of quantum bits in solids by deterministic single ion implantation and lithographic methods
  • Torsten Richter, Raith GmbH, Focused ion beams from GaBiLi LMAIS for nanofabrication and nano-analytics
  • Aydin Sabouri, University College London, Design of an electrostatic lens by differential-algebraic method and genetic algorithm
  • Amaia Sáenz, INMA, Universidad de Zaragoza, Optimization of tungsten-based deposits by Focused Ion Beam Induced Deposition on Scanning Probe Microscopy cantilevers
  • Silvia Schintke, University of Applied Sciences and Arts Western Switzerland, fit4nano for high school teachers: focused ion beam (FIB) technology – infographics, application examples, quiz questions and exercises
  • Christoph Schmid, Universität Tübingen, YBa2Cu3O7-δ Josephson junctions written with a focused He ion beam
  • Clemens Schmid, University of Vienna, Vortex Chains and Vortex Jets in FIB-Milled MoSi Microbridges
  • Lukas Seewald, Technische Universität Graz, 3D Nanoprinting of advanced AFM nanoprobes
  • Ivan Shorubalko, EMPA, Nanostructuring of graphene membranes with focused ion beams: towards 2D Metamaterials
  • Krisjanis Smits, University of Latvia, Formation of translucent nanostructured zirconia ceramics
  • Alex Storey, UCL, A Wien filter to separate beams of ionic liquid ions
  • Aleksandra Szkudlarek AGH University of Science and Technology, Atomic Scale Structure of Cobalt FEBID tips resolved by Atom Probe Tomography and Transmission Electron Microscopy
  • Aleksei Tsarapkin, Ferdinand-Braun-Institut für Höchstfrequenztechnik (FBH), Towards tunable graphene phononic crystals
  • Evgeniia Volobueva, IST Austria, Rotor stage for Electron BackScatter Diffraction analysis
  • Anna Weitzer, Graz University of Technology, High Precision 3D Nanoprinting of Sheet-like Structures and their Controlled Spatial Bending via Electron Beam Curing
  • Krzysztof Wieczerzak, Empa, Overcoming Challenges in FIB-TOF-SIMS Mapping with Fluorine Gas Assistance
  • Robert Winkler, Graz University of Technology, Functional Imprinting: Local Modification of Beam Induced Deposits
  • Oksana Yurkevich, Polymerinorganic hybrids for inducing selfhealing functionality in metal oxides
  • Wiktoria Zajkowska, Institute of Physics PAS, Piezoelectric-magnetostrictive hybrid nanowires for nano magneto-electro-mechanical systems (NMEMS) fabricated with FIB
  • Amina Zid, HZDR, Use case with nanospace: How an analytical FIB-SEM-SIMS tool helps to understand contaminations on a wafer surface