FIB Status
FIB Technology available Offers STSMs
Research Interests
Chemistry and Chemical Engineering, Earth Science, Engineering and Technology in Research, Material Science
A summary of our fit4nano work
NenoVision is a Czech start-up company that devolps and fabricates LiteScope™, a unique Atomic Force Microscope (AFM) made for integration into Scanning Electron Microscopes (SEM). LiteScope broadens the present possibilities of electron microscopy and enables simultaneous scanning of samples by different techniques. The acquired images are correlated into resulting 3D image with the use of novel CPEM technology.
Contact Information
Czech RepublicName of Institution
Address
Purkyňova 649/127, 612 00 Brno, Czech Republic
Website
Action Members
Jan Neuman
Facilities Directory
What FIB technology is Available
Ga/Dual Beam
Complementary Techniques
AFM/cAFM/MFM, gas-injection, KPFM, XRD or other X-ray techniques
Other Complementary Techniques
In-Situ AFM
