Postdoc position at IMB-CNM-CSIC

The Institute of Microelectronics of Barcelona is looking to fill a 2 year Postdoc position on the topic of Tunable Superconductivity in Thin Films for Quantum Sensing by Advanced Ion Irradiation Methods (QUTE). Please see the job description below or download it here.

BJN special issue

As previously announced, the Beilstein Journal of Nanotechnology is publishing a special issue on Focued Ion and electron beams for synthesis and characterization of nanomaterials. The submission deadline has been extended until 29th February 2024. All information is available at

ITC Conference Grant Call – GP4

The new call for ITC conference grants was just published and can be downloaded here. FIT4NANO is able to support a selected number of Action Members with their travel costs and participation fees of FIB-related conferences. Please read the rules carefully before applying and don’t forget to mention FIT4NANO in your abstract and presentation!

Vacancy for a “Principal Investigator in electron microscopy instrumentation” at TU Delft

A position for a “Full, Associate or Assistant Professor in Electron Microscopy Instrumentation” is vacant at TU Delft, the Netherlands.  “The Department of Imaging Physics at TU Delft has a strong, long-standing tradition in the development and application of new methods and technologies for electron microscopy. To strengthen our research in this direction, we are […]

STSM call announcement

STSM applications for FIT4NANO’s 4th grant period can now be submitted in e-COST. Submission deadline: 25 November 2023 Acceptance information: ~ 20 December 2023 Earliest start date: 1 January 2024 The call and all relevant rules can be found on the dedicated STSM site. 

HZDR lecture series “Materials Science Using Ions” (online participation possible)

HZDR will offer a hybrid course on „Materials Science Using Ions“ every Friday from 1 to 2:30 p.m. CET, starting on November 10th. 10 November 2023Shengqiang Zhou – Introduction: irradiation, ion irradiation and our life, Interaction between ions and materials: binary collision approximation 17 November 2023Shengqiang Zhou – Ion stopping in materials, Effects in materials […]

PhD position at TU Delft: Simulation of Scanning Electron Microscope (SEM) Images

Electron microscopy is at the heart of innovations and applications on the nanoscale in a wide range of sectors. The technology is, for instance, used in the semiconductor industry to observe engineered nanodevices, as well as for medical applications like cancer research. The major challenge of using a scanning electron microscope (SEM) is to correctly […]

WG3 (+4) meeting announcement

A combined WG3 / WG4 meeting will take place on 29th of September in Tirana, Albania. This hybrid meeting mainly focuses on the following topics: defect engineering / SII tomography of energy materials and machine learning unconventional processing advanced FIB processing in industry FIB processing of radioactive samples cryo tomography of biological samples heterogeneous integration […]

Thematic issue – Beilstein Journal of Nanotechnology accepting submissions

The deadline for submission to the special issue “Focused ion and electron beams for synthesis and characterization of nanomaterials” of the Beilstein Journal of Nanotechnology (JIF: 3.1) has been extended to 29 February 2024. The Beilstein Journal is a platinum open source journal with no subscription or publishing fee. All submissions will undergo rigorous peer […]