Registration for the 3rd FIT4NANO workshop in Lisbon is now closed for in person participation. Due to high demand, we will be streaming the workshop to enable participation even if you cannot travel to Lisbon. Online registration is available at https://events.hifis.net/event/585/
If you were thinking about attending the FIT4NANO workshop in Lisbon, please register at https://events.hifis.net/event/585/ as the registration deadline is approaching fast. Last day to do so is Thursday 15 June 2023. The full program is available at https://fit4nano.eu/workshop-2023/workshop-program/
The program for this year’s workshop is set and can be viewed here. Please note that the program is subject to change. If you are interested in joining the workshop, registration is open until 15 June at https://events.hifis.net/event/585/
Raith GmbH is looking for a charged particle optics designer to start at their Dortmund branch as soon as possible. Responsibilities: design and simulation of electron and ion columns for nanostructuring and imaging design and development of technical demonstrators for functional verification of novel components and systems in close cooperation with the team members from […]
Abstracts can be submitted until 12 p.m. (noon) on Monday, 15th of May. Applications for travel grants are also accepted until then.
The second FIT4NANO newsletter was just published and can be downloaded here. Topics covered are the upcoming FIT4NANO workshop, STSM reports, recent publications by our Action members, and other news from our Action as well as COST.
This is a reminder that abstracts for the 3rd FIT4NANO workshop in Lisbon can only be submitted until Wednesday, 10th of May. The same goes for applications for travel support, which will primarily be given to participants with accepted contributions. If you were planning on submitting an abstract, please do so within the next few […]
In this grant period, FIT4NANO is again offering ITC Conference grants and dissemination conference grants. Please read the call carefully before applying. Grants will be given on a first come, first serve basis until the allocated budget is exhausted.
funded by a large semiconductor company. Objective:With the trend towards 3D integration in semiconductor technology, metrology of buried devices requires the removal of an increasing amount of material. Industry has responded to this need by the commercialization of Xe plasma focused ion beam (FIB) microscopy tools. Compared to Ga ions used in conventional FIBs, Xe […]
Three FIT4NANO members, working in leading positions in academia as well as in industry, will host a webinar to talk about their not so conventional career paths. The so-called role model webinar takes place on Friday, 24th of February at 2 p.m. CET, and is aimed at anyone on a career-finding path. Meant to inspire […]