Please consider submitting an abstract to the Advanced Ion Microscopy & Ion Beam Nano-Engineering Focus Topic at the upcoming AVS meeting in Pittsburgh, PA, USA.
For 10 years, this has been an international meeting of users and developers of advanced focused ion beams.
AVS 68 is taking place from 6-11 November 2022.
The abstract submission deadline is on 31 May 2022.
Find out more at: